Reliable MicroSystems

Jeffrey Kauppila

CTO/Senior Project Manager
What you
should know About Dr. Jeffrey Kauppila


In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…

Management Team

Dr. Jeffrey Kauppila

CTO/Senior Project Manager

Jeffrey Kauppila, Ph.D., PE is a Senior Research Engineer with Vanderbilt University’s Institute for Space and Defense Electronics (ISDE), where he works in the area of radiation effects modeling and radiation hardened design for microelectronics. He received his Ph.D. in Electrical Engineering (2015), M.S. in Electrical Engineering (2003), and his B.E. in Electrical Engineering (2001) all from Vanderbilt University.  Dr. Kauppila joined ISDE in 2003 and his research focus has centered on the development of radiation-effects-enabled compact models, integration of models with existing and custom developed process-design-kits (PDK), and the application of the radiation-enabled models in the design of radiation-hardened strategic defense systems electronics. Dr. Kauppila is actively involved in the development and design of integrated circuits and test structures used to extract and calibrate electrical and radiation-enabled model parameters.

Dr. Kauppila has analog/mixed signal design experience in bipolar junction transistor, bulk CMOS, silicon-on-insulator CMOS, and FinFET technologies with minimum process feature sizes from 6um to 14nm. Dr. Kauppila has also been involved in design support activities for a DOD strategic defense system program in multiple design disciplines, including analog/mixed signal integrated circuits, control electronics modules, and power supply/converter design. Dr. Kauppila has served as a reviewer for the IEEE Transactions on Nuclear Science and the Journal of Radiation Effects Research and Engineering several times. Dr. Kauppila has multiple technical/trade publications. Dr. Kauppila is a licensed professional engineer in the state of Tennessee.

Reliable MicroSystems, LLC (Rel-Micro) is a world-class design organization specializing in concept-to-foundry creation and maturation of high-reliability electronic for mission-critical applications. We are based in Nashville, Tennessee


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