Reliable MicroSystems

Jason Rowe

Staff Engineer
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What you
should know About Jason Rowe

Publications

In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…

Engineering Team

Jason Rowe

Staff Engineer

Jason Rowe earned his Bachelors of Science in Electrical Engineering from Tennessee Technological University in 2001, and his Masters of Science in Electrical Engineering from Vanderbilt University in 2003, both with honors.  From 2004 to 2016 he worked as a Staff Engineer for Vanderbilt University’s Institute for Space and Defense Electronics (ISDE) in the area of radiation effects modeling.  A large portion of this time included working on the Trident II Missile D5 Life Extension Program.

Related work topics for the program included electrical and radiation model development, testing and calibration for analog/mixed signal, digital and discrete components.  Mr. Rowe has also been involved in simulation, modeling and design support activities including EDA tool evaluations and training courses, parts qualification, lot acceptance, procurement and surveillance.  He has expertise in ground based radiation testing on electronics for total-ionizing dose, neutron, dose rate and single event environments.  Previous experience includes radiation effects work with Air Force Research Laboratory and Sandia National Laboratory at Kirtland Air Force base.  Mr. Rowe has served as a reviewer for the IEEE Transactions on Nuclear Science and has multiple technical publications and presentations.

Reliable MicroSystems, LLC (Rel-Micro) is a world-class design organization specializing in concept-to-foundry creation and maturation of high-reliability electronic for mission-critical applications. We are based in Nashville, Tennessee

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